Oxford Instruments launches new coating thickness measurement analyser X-Strata920
Oxford Instruments is pleased to announce the new X-Strata920 X-ray fluorescence (XRF) analyser for coating
thickness measurement and materials analysis. It combines a large area proportional detector and Oxford Instruments' micro-focus X-ray tube, ...See all stories on this topic »
This glue news was spotted at Google Alerts - coating
Get the full story direct from source..