Oxford Instruments launches new coating thickness measurement analyser X-Strata920
by HotMeltNews • • Comments Off on Oxford Instruments launches new coating thickness measurement analyser X-Strata920
Oxford Instruments is pleased to announce the new X-Strata920 X-ray fluorescence (XRF) analyser for coating thickness measurement and materials analysis. It combines a large area proportional detector and Oxford Instruments' micro-focus X-ray tube, ... See all stories on this topic »